Bruker Probe Surface Profiler (Step Tester) DektakXT
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(I. Overview
Bruker's DektakXT (probe-type surface profiler) design innovation, achieves higher repeatability and resolution, and the vertical height repeatability is <5Å. This milestone product is derived from the excellent surface measurement technology that the Dektak series has occupied the industry's ling xian position for forty years. It has achieved nanometer-scale surface profile measurement, and has shown its skills in the fields of microelectronics, semiconductors, solar energy, high-brightness LEDs, touch screens, medical treatment, scientific research and materials science.
Step height repeatability is better than 5 Å (<5 Å)
· Single-arch gantry design achieves breakthrough scanning stability
· Advanced "intelligent electronic devices" have achieved a new benchmark for low noise
Easy to operate, efficient and easy to use
· Intuitive Vision64TM software simplifies the operation process of the user interface
· Unique sensor design enables ultra-micro force and large force measurement to be achieved on a single platform
· Self-aligned probe design allows users to easily replace the probe
(2) History: more than 40 years of technological innovation
In the past 40 years, there have been tens of thousands of Dektak series products used in various fields worldwide, widely used in the measurement of film thickness, stress, surface roughness and surface profile. They are widely praised for their quality, reliability, and efficiency.
(Three), performance: perfect design, outstanding performance
The performance of the step meter depends on the following three aspects: test repeatability, test speed, and ease of operation. These factors determine the quality of experimental data and the efficiency of experimental operations. DektakXT adopts a brand-new instrument system structure and optimized measurement and data processing software to achieve reliable, fast and simple sample detection to achieve the best instrument use effect.
Excellent test repeatability
l The design of DektakXT™ probe profiler ling xian guarantees its excellent performance, and the measurement repeatability is below 5 angstroms.
l The single-arch gantry design is stronger and more durable than the previous cantilever beam PCB design and is not easy to be damaged, which greatly reduces the impact of sound and vibration noise in the surrounding environment on the test signal.
l Bruker has perfected the intelligent electronic devices of the instrument, improved the stability of the working performance, and reduced the influence of temperature changes on the device; the measurement error caused by the system and environmental noise was reduced to a small amount.